Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

An updated micromouse competition

Ning Chen  
Dept. of Electr. Eng., California State Univ., Fullerton, CA;

This paper appears in: Frontiers in Education Conference, 1996. FIE '96. 26th Annual Conference., Proceedings of
Publication Date: 6-9 Nov 1996
Volume: 3,  On page(s): 1057-1059 vol.3
Meeting Date: 11/06/1996 - 11/09/1996
Location: Salt Lake City, UT, USA
ISBN: 0-7803-3348-9
References Cited: 2
INSPEC Accession Number: 5496674
Digital Object Identifier: 10.1109/FIE.1996.567748
Posted online: 2002-08-06 20:47:41.0

Abstract
The original micromouse competition in which miniature robots compete for the title of best speed and intelligence was first started around 1978. Over the years it became one of the few student competitions among engineering schools around the world. Nevertheless, the participation rate had never reached a significant level. Furthermore, since the competition's debut, no major changes on the game rules which were designed around the technology almost 20 years ago had been made. In this paper an updated micromouse competition is proposed. The updated game is designed to achieve the following goals: (1) Generating high participation rate from engineering students; (2) Promoting multidisciplinary undergraduate engineering activities; (3) Encouraging the use of current technologies; (4) Lowering the overall costs an managing the competition by engineering schools and on building the micromouse by students. This paper presents an updated micromouse game plan and competition rules. A micromouse design example developed at California State University, Fullerton (CSUF) for the new game is also included

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
Access this document
Full Text: PDF (204 KB)
» Buy this document now
»  Learn more about
» Learn more about
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved