Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Gaussian Interference Channel Capacity to Within One Bit: the General Case
Etkin, Raul H.   Tse, David N. C.   Wang, Hua  
Hewlett-Packard Laboratories, Palo Alto, CA 94304, USA. Email: raul.etkin@hp.com;

This paper appears in: Information Theory, 2007. ISIT 2007. IEEE International Symposium on
Publication Date: 24-29 June 2007
On page(s): 2181-2185
Location: Nice,
ISBN: 978-1-4244-1397-3
Digital Object Identifier: 10.1109/ISIT.2007.4557543
Current Version Published: 2008-07-09

Abstract
The characterization of the capacity region of the two-user Gaussian interference channel has been an open problem for thirty years. The understanding on this problem has been limited. The best known achievable region is due to Han-Kobayashi but its characterization is very complicated. It is also not known how tight the existing outer bounds are. In this work, we extend our results of [1] to general (i.e. possibly asymmetric) channels for the complete capacity region. We show that the existing outer bounds can in fact be arbitrarily loose in some parameter ranges, and by deriving new outer bounds, we show that a simplified Han-Kobayashi type scheme can achieve to within a single bit the capacity for all values of the channel parameters. Using our results, we provide a natural generalization of the point-to-point classical notion of degrees of freedom to interference-limited scenarios.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (840 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved